Tech stack
ETL Datawarehouse
Design / UI-UX
Back-end
Developed a non-damaging XPS/UPS measurement protocol for the study of a model EUV photoresist (CAR), supported by complementary techniques (XPS-mapping, AFM, optical microscopy) and quantum chemical simulations. Experienced with polymer resist thin-film preparation and processing, cleanroom processing, EUV exposures, layer thickness evaluation, and data analysis.
Performed an internship in the field of High-Harmonic Generation and EUV science, conducting experiments and theoretical calculations for generating EUV light.
Lectured on Basic Physics and Laboratory topics including Mechanics, Electricity, and Heat.
PhD research on EUV photoresist materials, involving non-damaging characterization techniques.
Thesis on amorphous semiconductors for optoelectronic applications; top student with GPA 17.31 of 20.
Bachelor in Applied Physics.